Issued Patents All Time
Showing 1–25 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12011788 | Crawling welding robot | Xiaobing Feng, Jiluan Pan | 2024-06-18 |
| 11786986 | Crawling welding robot and method of controlling the same | Xiaobing Feng, Jiluan Pan, Baiwa Pan, Ruimin Duan, Hailong Li | 2023-10-17 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Xiaochun Li, Pavan Kumar, Junqing Huang, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |
| 11244442 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Jan Lauber, Yong Zhang | 2022-02-08 |
| 11204332 | Repeater defect detection | Eugene Shifrin, Bjorn Brauer, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran | 2021-12-21 |
| 10818005 | Previous layer nuisance reduction through oblique illumination | Jingshan Zhong, Bjorn Brauer | 2020-10-27 |
| 10783673 | Method and apparatus for generating heatmap | Bing Ni | 2020-09-22 |
| 10648924 | Generating high resolution images from low resolution images for semiconductor applications | Jing Zhang, Grace Hsiu-Ling Chen, Kris Bhaskar, Keith Wells, Nan BAI +1 more | 2020-05-12 |
| 10648925 | Repeater defect detection | Eugene Shifrin, Bjorn Brauer, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran | 2020-05-12 |
| 10605744 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2020-03-31 |
| 10600175 | Dynamic care areas for defect detection | Bjorn Brauer, Benjamin Murray, Shishir Suman | 2020-03-24 |
| 10599944 | Visual feedback for inspection algorithms and filters | Hucheng Lee, Junqing Huang | 2020-03-24 |
| 10600177 | Nuisance reduction using location-based attributes | Bjorn Brauer, Junqing Huang | 2020-03-24 |
| 10514685 | Automatic recipe stability monitoring and reporting | Hucheng Lee, Govindarajan Thattaisundaram | 2019-12-24 |
| 10410338 | Method and system for correlating optical images with scanning electron microscopy images | Hucheng Lee, Jan Lauber, Yong Zhang | 2019-09-10 |
| 10393671 | Intra-die defect detection | Govindarajan Thattaisundaram, Hucheng Lee | 2019-08-27 |
| 10395358 | High sensitivity repeater defect detection | Bjorn Brauer, Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10395359 | Adaptive local threshold and color filtering | Junqing Huang, Hucheng Lee, Kenong Wu | 2019-08-27 |
| 10339262 | System and method for defining care areas in repeating structures of design data | Junqing Huang, Soren Konecky, Hucheng Lee, Kenong Wu | 2019-07-02 |
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Steve R. Lange, Xuguang Jiang, Ping Gu, Sylvain Muckenhirn | 2019-06-18 |
| 10181185 | Image based specimen process control | Allen Park, Ashok Kulkarni, Saibal Banerjee, Ping Gu, Songnian Rong +1 more | 2019-01-15 |
| 10132760 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2018-11-20 |
| 10127652 | Defect detection and classification based on attributes determined from a standard reference image | Avijit K. Ray-Chaudhuri, Raghav Babulnath, Kenong Wu | 2018-11-13 |
| 10012599 | Optical die to database inspection | Keith Wells, Xiaochun Li, Tao Luo, Markus Huber | 2018-07-03 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Thirupurasundari Jayaraman, Raghav Babulnath, Srikanth Kandukuri +4 more | 2018-06-12 |