Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11295432 | Broad band plasma inspection based on a nuisance map | Kaushik Reddy Vemareddy, Pavan Kumar Perali | 2022-04-05 |
| 11067516 | High accuracy of relative defect locations for repeater analysis | Kenong Wu, Hong Chen | 2021-07-20 |
| 10600175 | Dynamic care areas for defect detection | Bjorn Brauer, Benjamin Murray, Lisheng Gao | 2020-03-24 |
| 10365232 | High accuracy of relative defect locations for repeater analysis | Kenong Wu | 2019-07-30 |