Issued Patents All Time
Showing 1–25 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12229935 | Semantic image segmentation for semiconductor-based applications | Richard Wallingford | 2025-02-18 |
| 12056867 | Image contrast metrics for deriving and improving imaging conditions | Sangbong Park, Hucheng Lee | 2024-08-06 |
| 11983865 | Deep generative model-based alignment for semiconductor applications | Richard Wallingford | 2024-05-14 |
| 11961219 | Generative adversarial networks (GANs) for simulating specimen images | — | 2024-04-16 |
| 11748872 | Setting up inspection of a specimen | Hong Chen, Abdurrahman Sezginer, Sangbong Park, Ge Cong, Xiaochun Li | 2023-09-05 |
| 11694327 | Cross layer common-unique analysis for nuisance filtering | — | 2023-07-04 |
| 11619592 | Selecting defect detection methods for inspection of a specimen | Hucheng Lee, Sangbong Park | 2023-04-04 |
| 11615993 | Clustering sub-care areas based on noise characteristics | Boshi Huang, Hucheng Lee, Vladimir Tumakov, Sangbong Park, Erfan Soltanmohammadi | 2023-03-28 |
| 11580650 | Multi-imaging mode image alignment | Vaibhav Gaind | 2023-02-14 |
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, Richard Wallingford, James A. Smith, Xiaochun Li, Vladimir Tumakov | 2022-08-30 |
| 11415531 | Statistical learning-based mode selection for multi-mode inspection | Vaibhav Gaind | 2022-08-16 |
| 11416982 | Controlling a process for inspection of a specimen | Hucheng Lee, Sangbong Park | 2022-08-16 |
| 11328410 | Deep generative models for optical or other mode selection | — | 2022-05-10 |
| 11328411 | Print check repeater defect detection | Hong Chen, Kenong Wu, Xiaochun Li, James A. Smith, Eugene Shifrin +7 more | 2022-05-10 |
| 11328435 | Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods | Huan Jin, Xiaochun Li | 2022-05-10 |
| 11204332 | Repeater defect detection | Eugene Shifrin, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran, Lisheng Gao | 2021-12-21 |
| 11151711 | Cross layer common-unique analysis for nuisance filtering | — | 2021-10-19 |
| 11120546 | Unsupervised learning-based reference selection for enhanced defect inspection sensitivity | Nurmohammed Patwary, Sangbong Park, Xiaochun Li | 2021-09-14 |
| 11113827 | Pattern-to-design alignment for one-dimensional unique structures | — | 2021-09-07 |
| 11049745 | Defect-location determination using correction loop for pixel alignment | David Dowling, Tarunark Singh, Santosh Bhattacharyya, Bryant Mantiply, Hucheng Lee +2 more | 2021-06-29 |
| 11010885 | Optical-mode selection for multi-mode semiconductor inspection | Richard Wallingford, Kedar Grama, Hucheng Lee, Sangbong Park | 2021-05-18 |
| 10964016 | Combining simulation and optical microscopy to determine inspection mode | — | 2021-03-30 |
| 10957035 | Defect classification by fitting optical signals to a point-spread function | Soren Konecky | 2021-03-23 |
| 10922808 | File selection for test image to design alignment | — | 2021-02-16 |
| 10818005 | Previous layer nuisance reduction through oblique illumination | Jingshan Zhong, Lisheng Gao | 2020-10-27 |