Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11668655 | Multimode defect classification in semiconductor inspection | Grace Hsiu-Ling Chen, Amrit Poudel, Mark Wang | 2023-06-06 |
| 11580650 | Multi-imaging mode image alignment | Bjorn Brauer | 2023-02-14 |
| 11415531 | Statistical learning-based mode selection for multi-mode inspection | Bjorn Brauer | 2022-08-16 |
| 11116445 | Methods for locating discontinuities in tissue using optical imaging, surgical procedures, and devices for use during surgical procedures | Brian Zahler Bentz, Kevin John Webb, Timothy Cheng-Hsien Wu | 2021-09-14 |
| 10067072 | Methods and apparatus for speckle suppression in laser dark-field systems | Jason Kirkwood | 2018-09-04 |
| 9506873 | Pattern suppression in logic for wafer inspection | Nisha Amthul | 2016-11-29 |