AP

Amrit Poudel

KL Kla: 1 patents #347 of 758Top 50%
Overall (All Time): #2,587,422 of 4,157,543Top 65%
1
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Issued Patents All Time

Patent #TitleCo-InventorsDate
11668655 Multimode defect classification in semiconductor inspection Vaibhav Gaind, Grace Hsiu-Ling Chen, Mark Wang 2023-06-06