Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10801968 | Algorithm selector based on image frames | — | 2020-10-13 |
| 10713534 | Training a learning based defect classifier | — | 2020-07-14 |
| 10698325 | Performance monitoring of design-based alignment | — | 2020-06-30 |
| 10648925 | Repeater defect detection | Eugene Shifrin, Sumit Sen, Ashok Mathew, Sreeram Chandrasekaran, Lisheng Gao | 2020-05-12 |
| 10620135 | Identifying a source of nuisance defects on a wafer | — | 2020-04-14 |
| 10600177 | Nuisance reduction using location-based attributes | Junqing Huang, Lisheng Gao | 2020-03-24 |
| 10600175 | Dynamic care areas for defect detection | Benjamin Murray, Shishir Suman, Lisheng Gao | 2020-03-24 |
| 10557802 | Capture of repeater defects on a semiconductor wafer | Hucheng Lee | 2020-02-11 |
| 10535131 | Systems and methods for region-adaptive defect detection | Christopher Maher, Vijayakumar Ramachandran, Laurent Karsenti, Eliezer Rosengaus, John R. Jordan +1 more | 2020-01-14 |
| 10504213 | Wafer noise reduction by image subtraction across layers | — | 2019-12-10 |
| 10402688 | Data augmentation for convolutional neural network-based defect inspection | Vijay Ramachandran, Richard Wallingford, Scott A. Young | 2019-09-03 |
| 10395358 | High sensitivity repeater defect detection | Eugene Shifrin, Ashok Mathew, Chetana Bhaskar, Lisheng Gao, Santosh Bhattacharyya +2 more | 2019-08-27 |
| 10360477 | Accelerating semiconductor-related computations using learning based models | Kris Bhaskar, Scott A. Young, Mark J. Roulo, Jing Zhang, Laurent Karsenti +1 more | 2019-07-23 |
| 10360671 | Tool health monitoring and matching | Ravichander Rao, Gary Taan, Andreas Russ, Roger B. Davis, Bryant Mantiply +2 more | 2019-07-23 |
| 10192302 | Combined patch and design-based defect detection | Santosh Bhattacharyya | 2019-01-29 |
| 10186028 | Defect signal to noise enhancement by reducing die to die process noise | James A. Smith | 2019-01-22 |
| 10151706 | Inspection for specimens with extensive die to die process variation | Santosh Bhattacharyya, Hucheng Lee | 2018-12-11 |
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Ashok Kulkarni, Saibal Banerjee, Santosh Bhattacharyya | 2018-11-13 |
| 10115040 | Convolutional neural network-based mode selection and defect classification for image fusion | — | 2018-10-30 |
| 9702827 | Optical mode analysis with design-based care areas | Ravikumar Sanapala | 2017-07-11 |