Issued Patents All Time
Showing 1–25 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12402776 | Imaging catheter and imaging device | Mingxun Guan, Duangui Gao | 2025-09-02 |
| 12297522 | Nano-treatment of high strength aluminum alloys for manufacturing processes | Maximilian Sokoluk | 2025-05-13 |
| 12276639 | Large-space high-temperature and high-pressure true triaxial flexible loading device | Qiang Xue, Hang Ruan, Quan Jiang, Qingqian Wu | 2025-04-15 |
| D1060692 | Physiotherapy apparatus | Mingyu Tang, Zhijun Chen | 2025-02-04 |
| 12190498 | Print check repeater defect detection | Nurmohammed Patwary, James A. Smith, Heonju SHIN, Jusang Maeng, Kenong Wu +1 more | 2025-01-07 |
| 12190500 | Detecting defects on specimens | Chunwei Song, Siqing Nie, Weifeng Zhou, Sangbong Park | 2025-01-07 |
| 12165306 | Segmentation of design care areas with a rendered design image | Manikandan Mariyappan, Jin Qian, Zhuang LIU, Siqing Nie | 2024-12-10 |
| 11873225 | Modified montmorillonite self-repairing agent and preparation method and use thereof | Liwei Zhang, Kaiyuan Mei, Yan Wang, Manguang Gan | 2024-01-16 |
| D1005423 | Strength training dip stand | — | 2023-11-21 |
| 11822419 | Error information processing method and device, and storage medium | — | 2023-11-21 |
| 11803960 | Optical image contrast metric for optical target search | Huan Jin, Sangbong Park, Zhifeng Huang | 2023-10-31 |
| D1002759 | Strength training dip stand | — | 2023-10-24 |
| 11783470 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Hucheng Lee, Sangbong Park | 2023-10-10 |
| 11748872 | Setting up inspection of a specimen | Hong Chen, Bjorn Brauer, Abdurrahman Sezginer, Sangbong Park, Ge Cong | 2023-09-05 |
| 11507829 | Greedy approach for obtaining an artificial intelligence model in a parallel configuration | Yinbo Shi, Yequn Zhang, Bowei Liu | 2022-11-22 |
| 11475298 | Using quantization in training an artificial intelligence model in a semiconductor solution | Yongxiong Ren, Yi Fan, Yequn Zhang, Baohua Sun, Bin Yang +1 more | 2022-10-18 |
| 11431976 | System and method for inspection using tensor decomposition and singular value decomposition | Nurmohammed Patwary, Richard Wallingford, James A. Smith, Vladimir Tumakov, Bjorn Brauer | 2022-08-30 |
| 11406121 | Method of smart rice cookers capable of mixed grain cooking and abnormal conditions detection | Dongyan Wang, Linnan Zhu, Junyang Zhou | 2022-08-09 |
| 11389902 | Reducing surface asperities | Venkata Madhukanth Vadali, Chao Ma, Neil Arthur Duffie, Frank Ewald Pfefferkorn | 2022-07-19 |
| 11340116 | Optical gradation system and method | Yang Yang, Xinyang Liu, Huihui Huang | 2022-05-24 |
| 11335045 | Combining feature maps in an artificial intelligence semiconductor solution | Bin Yang, Lin Yang, Yequn Zhang, Yongxiong Ren, Yinbo Shi +1 more | 2022-05-17 |
| 11328435 | Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods | Bjorn Brauer, Huan Jin | 2022-05-10 |
| 11328411 | Print check repeater defect detection | Hong Chen, Kenong Wu, James A. Smith, Eugene Shifrin, Qing Luo +7 more | 2022-05-10 |
| 11308606 | Design-assisted inspection for DRAM and 3D NAND devices | Junqing Huang, Hucheng Lee, Sangbong Park | 2022-04-19 |
| 11270430 | Wafer inspection using difference images | Abdurrahman Sezginer, Pavan Kumar, Junqing Huang, Lisheng Gao, Grace Hsiu-Ling Chen +2 more | 2022-03-08 |