Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12190500 | Detecting defects on specimens | Siqing Nie, Weifeng Zhou, Xiaochun Li, Sangbong Park | 2025-01-07 |
| 11494895 | Detecting defects in array regions on specimens | Siqing Nie, Zhuang LIU, Weifeng Zhou | 2022-11-08 |