Issued Patents All Time
Showing 51–59 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8467047 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2013-06-18 |
| 8223327 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2012-07-17 |
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson +3 more | 2012-02-07 |
| 8059886 | Adaptive signature detection | Yong Gao, Junqing Huang | 2011-11-15 |
| 8049877 | Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system | Richard Wallingford, Stephanie Chen, Jason Kirkwood, Tao Luo, Yong Zhang | 2011-11-01 |
| 7729529 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson +3 more | 2010-06-01 |
| 7498542 | Control method and system for a trackless autonomous crawling all-position arc welding robot with wheels and permanent magnet caterpillar belts | Jiluan Pan, Bingyi Yan, Hua Zhang, Qinying Lu | 2009-03-03 |
| 7359544 | Automatic supervised classifier setup tool for semiconductor defects | Bo Magluyan, Jianxin Zhang, Kevin Yeung, Kenong Wu, Tong Huang | 2008-04-15 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Sandeep Bhagwat, Michal Kowalski, Vivekanand Kini +8 more | 2006-11-28 |