Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8213704 | Methods and systems for detecting defects in a reticle design pattern | Ed Yum | 2012-07-03 |
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ariel Tribble +3 more | 2012-02-07 |
| 8078304 | Dual-mode robot systems and methods for electronic device manufacturing | Michael R. Rice, Jeffrey C. Hudgens, Todd Egan | 2011-12-13 |
| 7769225 | Methods and systems for detecting defects in a reticle design pattern | Sagar A. Kekare, Moshe E. Preil | 2010-08-03 |
| 7729529 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ariel Tribble +3 more | 2010-06-01 |
| 7418124 | Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns | Mike Von Den Hoff, Jim Wiley | 2008-08-26 |
| 6902855 | Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns | Mike Von Den Hoff | 2005-06-07 |