Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8111900 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson +3 more | 2012-02-07 |
| 7729529 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Kenong Wu, David Randall, Kourosh Nafisi, Ramon Ynzunza, Ingrid B. Peterson +3 more | 2010-06-01 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Sandeep Bhagwat, Michal Kowalski, Vivekanand Kini +8 more | 2006-11-28 |