Issued Patents All Time
Showing 26–50 of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9915625 | Optical die to database inspection | Tao Luo, Keith Wells, Xiaochun Li | 2018-03-13 |
| 9880107 | Systems and methods for detecting defects on a wafer | Lu Chen, Jason Kirkwood, Mohan Mahadevan, James A. Smith, Junqing Huang +2 more | 2018-01-30 |
| 9846930 | Detecting defects on a wafer using defect-specific and multi-channel information | Kenong Wu, Grace Hsiu-Ling Chen, David W. Shortt | 2017-12-19 |
| 9830421 | Alignment of inspection to design using built in targets | Santosh Bhattacharyya, Bjorn Braeuer | 2017-11-28 |
| 9726617 | Apparatus and methods for finding a best aperture and mode to enhance defect detection | Pavel Kolchin, Richard Wallingford, Grace Hsiu-Ling Chen, Markus Huber, Robert M. Danen | 2017-08-08 |
| 9727047 | Defect detection using structural information | Qing Luo, Kenong Wu, Hucheng Lee, Eugene Shifrin, Yan Xiong +1 more | 2017-08-08 |
| 9721337 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Meng-Che Wu | 2017-08-01 |
| 9715725 | Context-based inspection for dark field inspection | Yong Zhang, Tao Luo, Chaohong Wu, Stephanie Chen | 2017-07-25 |
| 9704234 | Adaptive local threshold and color filtering | Junqing Huang, Hucheng Lee, Kenong Wu | 2017-07-11 |
| 9619876 | Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modes | Junqing Huang | 2017-04-11 |
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet +1 more | 2017-03-21 |
| 9563943 | Based sampling and binning for yield critical defects | Satya Kurada, Raghav Babulnath, Kwok Ng | 2017-02-07 |
| 9552636 | Detecting defects on a wafer using defect-specific and multi-channel information | Kenong Wu, Grace Hsiu-Ling Chen, David W. Shortt | 2017-01-24 |
| 9523646 | Wafer and reticle inspection systems and methods for selecting illumination pupil configurations | Grace Hsiu-Ling Chen, Rudolf Brunner, Robert M. Danen, Lu Chen | 2016-12-20 |
| 9442077 | Scratch filter for wafer inspection | Junqing Huang, Huan Jin, Grace Hsiu-Ling Chen | 2016-09-13 |
| 9347891 | Wafer and reticle inspection systems and methods for selecting illumination pupil configurations | Grace Hsiu-Ling Chen, Rudolf Brunner, Robert M. Danen, Lu Chen | 2016-05-24 |
| 9310320 | Based sampling and binning for yield critical defects | Satya Kurada, Raghav Babulnath, Kwok Ng | 2016-04-12 |
| 9224660 | Tuning wafer inspection recipes using precise defect locations | Ashok Kulkarni, Junqing Huang | 2015-12-29 |
| 9189844 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Meng-Che Wu | 2015-11-17 |
| 9171364 | Wafer inspection using free-form care areas | Kenong Wu, Tao Luo, Eugene Shifrin, Aravindh Balaji | 2015-10-27 |
| 9092846 | Detecting defects on a wafer using defect-specific and multi-channel information | Kenong Wu, Grace Hsiu-Ling Chen, David W. Shortt | 2015-07-28 |
| 9053527 | Detecting defects on a wafer | Jun Lang, Kan-Nan Chen, Junqing Huang | 2015-06-09 |
| 8989479 | Region based virtual fourier filter | Kenong Wu, Allen Park, Ellis Chang, Khurram Zafar, Junqing Huang +5 more | 2015-03-24 |
| 8775101 | Detecting defects on a wafer | Junqing Huang, Yong Zhang, Stephanie Chen, Tao Luo, Richard Wallingford | 2014-07-08 |
| 8532949 | Computer-implemented methods and systems for classifying defects on a specimen | Cho H. Teh, Tommaso Torelli, Dominic David, Chiuman Yeung, Michael Gordon Scott +5 more | 2013-09-10 |