Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601393 | Selecting one or more parameters for inspection of a wafer | Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet +1 more | 2017-03-21 |
| 9310316 | Selecting parameters for defect detection methods | Kenong Wu, Michael J. Van Riet, Yi-Chang Liu | 2016-04-12 |
| 9037280 | Computer-implemented methods for performing one or more defect-related functions | Mark Dishner, Sharon McCauley, Patrick Huet, David Wang | 2015-05-19 |
| 8948494 | Unbiased wafer defect samples | Martin Plihal, Vidyasagar Anantha, Saravanan Paramasivam | 2015-02-03 |
| 8392136 | In-place management of semiconductor equipment recipes | Dominic David | 2013-03-05 |