Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Ellis Chang, William Volk, James Wiley, Sterling Watson +2 more | 2022-05-31 |
| 10713771 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Ellis Chang, William Volk, James Wiley, Sterling Watson +2 more | 2020-07-14 |
| 9037280 | Computer-implemented methods for performing one or more defect-related functions | Mark Dishner, Chris W. Lee, Patrick Huet, David Wang | 2015-05-19 |
| 9002497 | Methods and systems for inspection of wafers and reticles using designer intent data | William Volk, James Wiley, Sterling Watson, Sagar A. Kekare, Carl Hess +2 more | 2015-04-07 |
| 7570800 | Methods and systems for binning defects detected on a specimen | Jason Z. Lin, Xing Chu, Kenong Wu | 2009-08-04 |
| 7142992 | Flexible hybrid defect classification for semiconductor manufacturing | Patrick Huet, Maruti Shanbhag, Sandeep Bhagwat, Michal Kowalski, Vivekanand Kini +8 more | 2006-11-28 |
| 7072786 | Inspection system setup techniques | David Bruce Coldren, Prashant Aji, David Randall | 2006-07-04 |
| 6959251 | Inspection system setup techniques | David Bruce Coldren, Prashant Aji, David Randall | 2005-10-25 |