Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Sharon McCauley, Ellis Chang, William Volk, James Wiley, Sterling Watson +2 more | 2022-05-31 |
| 10713771 | Methods and systems for inspection of wafers and reticles using designer intent data | Sharon McCauley, Ellis Chang, William Volk, James Wiley, Sterling Watson +2 more | 2020-07-14 |
| 9002497 | Methods and systems for inspection of wafers and reticles using designer intent data | William Volk, James Wiley, Sterling Watson, Sagar A. Kekare, Carl Hess +2 more | 2015-04-07 |
| 8384887 | Methods and systems for inspection of a specimen using different inspection parameters | Steve R. Lange, Nat Ceglio, Shiow-Hwei Hwang, Tao-Yi Fu | 2013-02-26 |
| 7738089 | Methods and systems for inspection of a specimen using different inspection parameters | Steve R. Lange, Nat Ceglio, Shiow-Hwei Hwang, Tao-Yi Fu | 2010-06-15 |
| 7514681 | Electrical process monitoring using mirror-mode electron microscopy | Mark A. McCord, Marian Mankos, David L. Adler | 2009-04-07 |
| 7236847 | Systems and methods for closed loop defect reduction | — | 2007-06-26 |
| 5804004 | Stacked devices for multichip modules | David B. Tuckerman, Nicholas Brathwaite, Kirk Flatow | 1998-09-08 |