SH

Shiow-Hwei Hwang

KL Kla-Tencor: 13 patents #442 of 1,394Top 35%
📍 San Ramon, CA: #323 of 2,140 inventorsTop 20%
🗺 California: #46,935 of 386,348 inventorsTop 15%
Overall (All Time): #383,632 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
10429319 Inspection system including parallel imaging paths with multiple and selectable spectral bands Amir Bar, Grace Hsiu-Ling Chen, Daniel L. Cavan 2019-10-01
9052494 Optical imaging system with catoptric objective; broadband objective with mirror; and refractive lenses and broadband optical imaging system having two or more imaging paths Gregory L. Kirk, Hwan J. Jeong, David Shafer, Russel Hudyma 2015-06-09
8575576 Optical imaging system with laser droplet plasma illuminator Richard W. Solarz, Stephane Durant 2013-11-05
8384887 Methods and systems for inspection of a specimen using different inspection parameters Steve R. Lange, Paul Frank Marella, Nat Ceglio, Tao-Yi Fu 2013-02-26
8355140 Systems configured to generate output corresponding to defects on a specimen Tao-Yi Fu, Xiumei Liu 2013-01-15
8178860 Image collection Gregory L. Kirk, Matthew Derstine, Isabella Talley Lewis 2012-05-15
7924434 Systems configured to generate output corresponding to defects on a specimen Tao-Yi Fu, Xiumei Liu 2011-04-12
7738089 Methods and systems for inspection of a specimen using different inspection parameters Steve R. Lange, Paul Frank Marella, Nat Ceglio, Tao-Yi Fu 2010-06-15
7327464 System and method for coherent optical inspection Tao-Yi Fu 2008-02-05
7259869 System and method for performing bright field and dark field optical inspection Nat Ceglio 2007-08-21
7209239 System and method for coherent optical inspection Tao-Yi Fu 2007-04-24
7095507 Method and apparatus using microscopic and interferometric based detection Nat Ceglio 2006-08-22
7061625 Method and apparatus using interferometric metrology for high aspect ratio inspection Tao-Yi Fu 2006-06-13