Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11755168 | Infrared touch display screen | Xukai Wang, Qingsong Yin | 2023-09-12 |
| 11339218 | Human monoclonal antibodies against LAG3 and uses thereof | Weizao Chen, Zuoxiang Xiao | 2022-05-24 |
| 11314043 | Lens assembly including six lenses of −−++−+ refractive powers | Jian-Wei Lee | 2022-04-26 |
| 11187874 | Wide-angle lens assembly | An-Kai Chang | 2021-11-30 |
| 10742989 | Variable frame rate encoding method and device based on a still area or a motion area | Jun Wang, Jiejun Li | 2020-08-11 |
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Steve R. Lange, Lisheng Gao, Xuguang Jiang, Ping Gu, Sylvain Muckenhirn | 2019-06-18 |
| 9989732 | Lens assembly | — | 2018-06-05 |
| 9625810 | Source multiplexing illumination for mask inspection | Daimian Wang, Daniel Wack, Damon F. Kvamme | 2017-04-18 |
| 9151718 | Illumination system with time multiplexed sources for reticle inspection | Daimian Wang, Damon F. Kvamme | 2015-10-06 |
| 8384887 | Methods and systems for inspection of a specimen using different inspection parameters | Steve R. Lange, Paul Frank Marella, Nat Ceglio, Shiow-Hwei Hwang | 2013-02-26 |
| 8355140 | Systems configured to generate output corresponding to defects on a specimen | Shiow-Hwei Hwang, Xiumei Liu | 2013-01-15 |
| 7924434 | Systems configured to generate output corresponding to defects on a specimen | Shiow-Hwei Hwang, Xiumei Liu | 2011-04-12 |
| 7858911 | Confocal wafer inspection system and method | Christopher R. Fairley, Bin-Ming Benjamin Tsai, Scott A. Young | 2010-12-28 |
| 7738089 | Methods and systems for inspection of a specimen using different inspection parameters | Steve R. Lange, Paul Frank Marella, Nat Ceglio, Shiow-Hwei Hwang | 2010-06-15 |
| 7554655 | High throughput brightfield/darkfield water inspection system using advanced optical techniques | Christopher R. Fairley, Gershon Perelman, Bin-Ming Benjamin Tsai | 2009-06-30 |
| 7535563 | Systems configured to inspect a specimen | Grace Hsiu-Ling Chen, Jamie M. Sullivan, Shing Lee, Greg Kirk | 2009-05-19 |
| 7522275 | High throughput darkfield/brightfield wafer inspection system using advanced optical techniques | Christopher R. Fairley, Gershon Perelman, Bin-Ming Benjamin Tsai | 2009-04-21 |
| 7436503 | Dark field inspection apparatus and methods | Grace Hsiu-Ling Chen, Evan R. Mapoles | 2008-10-14 |
| 7399950 | Confocal wafer inspection method and apparatus using fly lens arrangement | Christopher R. Fairley, Bin-Ming Benjamin Tsai, Scott A. Young | 2008-07-15 |
| 7379173 | High throughput brightfield/darkfield wafer inspection system using advanced optical techniques | Christopher R. Fairley, Gershon Perelman, Bin-Ming Benjamin Tsai | 2008-05-27 |
| 7327464 | System and method for coherent optical inspection | Shiow-Hwei Hwang | 2008-02-05 |
| 7317527 | Spatial light modulator fourier transform | Dragos Maciuca, Grace Hsiu-Ling Chen | 2008-01-08 |
| 7259844 | High throughput darkfield/brightfield wafer inspection system using advanced optical techniques | Christopher R. Fairley, Gershon Perelman, Bin-Ming Benjamin Tsai | 2007-08-21 |
| 7209239 | System and method for coherent optical inspection | Shiow-Hwei Hwang | 2007-04-24 |
| 7164475 | High throughput brightfield/darkfield wafer inspection system using advanced optical techniques | Christopher R. Fairley, Gershon Perelman, Bin-Ming Benjamin Tsai | 2007-01-16 |