Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7505619 | System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface | Grace Hsiu-Ling Chen, Christopher F. Bevis, David W. Shortt | 2009-03-17 |
| 7436503 | Dark field inspection apparatus and methods | Grace Hsiu-Ling Chen, Tao-Yi Fu | 2008-10-14 |
| 7106432 | Surface inspection system and method for using photo detector array to detect defects in inspection surface | Grace Hsiu-Ling Chen, Christopher F. Bevis, David W. Shortt | 2006-09-12 |
| 7106434 | Inspection tool | Ralph C. Wolf | 2006-09-12 |
| 6989515 | Imaging stabilization apparatus and method for high-performance optical systems | Michael A. Newcomb, David Gaines, Steve Shannon | 2006-01-24 |
| 6617555 | Imaging stabilization apparatus and method for high-performance optical systems | Michael A. Newcomb, David Gaines, Steve Shannon | 2003-09-09 |