Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11748871 | Alignment of a specimen for inspection and other processes | Tong Huang, N R Girish, Yiyu Zhang, Faisal Omer, Wei Kang +2 more | 2023-09-05 |
| 11676260 | Variation-based segmentation for wafer defect detection | — | 2023-06-13 |
| 11610296 | Projection and distance segmentation algorithm for wafer defect detection | JuHwan Rha | 2023-03-21 |
| 10533953 | System and method for wafer inspection with a noise boundary threshold | Yong Zhang | 2020-01-14 |
| 10402963 | Defect detection on transparent or translucent wafers | Yong Zhang, Yiwu Ding | 2019-09-03 |
| 10372113 | Method for defocus detection | Shifang Li, Yong Zhang | 2019-08-06 |
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Steve R. Lange, Lisheng Gao, Ping Gu, Sylvain Muckenhirn | 2019-06-18 |
| 10043265 | System, method and computer program product for identifying fabricated component defects using a local adaptive threshold | Tong Huang, Yong Zhang | 2018-08-07 |
| 7711164 | System and method for automatic segmentation of vessels in breast MR sequences | Gerardo Hermosillo Valadez | 2010-05-04 |