DS

David Shafer

CG Carl Zeiss Smt Gmbh: 47 patents #16 of 1,189Top 2%
KL Kla-Tencor: 33 patents #66 of 1,394Top 5%
PE Perkinelmer: 11 patents #12 of 671Top 2%
CS Carl Zeiss Stiftung: 9 patents #20 of 654Top 4%
CG Carl Zeiss Microscopy Gmbh: 5 patents #95 of 564Top 20%
University of California: 4 patents #2,189 of 18,278Top 15%
KI Kla Instruments: 4 patents #5 of 99Top 6%
UN Unknown: 3 patents #7,366 of 83,584Top 9%
FS Federal Signal: 2 patents #162 of 717Top 25%
US Ultratech Stepper: 2 patents #14 of 40Top 35%
LS Litton Systems: 1 patents #380 of 838Top 50%
EL Euv Llc.: 1 patents #33 of 57Top 60%
CA Carl Zeiss Ag: 1 patents #120 of 312Top 40%
SP Spectratech: 1 patents #5 of 12Top 45%
TR Tropel: 1 patents #10 of 19Top 55%
📍 Fairfield, CT: #3 of 661 inventorsTop 1%
🗺 Connecticut: #60 of 34,797 inventorsTop 1%
Overall (All Time): #8,046 of 4,157,543Top 1%
133
Patents All Time

Issued Patents All Time

Showing 1–25 of 133 patents

Patent #TitleCo-InventorsDate
10969694 Projection lens, projection exposure apparatus and projection exposure method Alexander Epple 2021-04-06
10481500 Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type Hans-Juergen Mann, Wilhelm Ulrich, Erik Loopstra 2019-11-19
10371574 Detector device for detection of a spectral portion for a microscope Tiemo Anhut, Matthias Wald 2019-08-06
10132685 Detector device for detection of a spectral portion for a microscope Tiemo Anhut, Matthias Wald 2018-11-20
10073256 Device for imaging sample Wolfgang Singer, Ralf Wolleschensky, Wilhelm Ulrich, Artur Degen 2018-09-11
9804378 Arrangement for light sheet microscopy Wolfgang Singer, Artur Degen, Jörg Siebenmorgen 2017-10-31
9772478 Catadioptric projection objective with parallel, offset optical axes Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple 2017-09-26
9684182 Optical image offset device, optical image stabilization device and optical observation apparatus Marco Pretorius 2017-06-20
9535337 Imaging optics, microlithography projection exposure apparatus having same and related methods Hans-Juergen Mann 2017-01-03
9500958 Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type Hans-Juergen Mann 2016-11-22
9377414 EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafers Yung-Ho Alex Chuang, Richard W. Solarz, Bin-Ming Benjamin Tsai, David L. Brown 2016-06-28
9304407 Catoptric objectives and systems using catoptric objectives Hans-Juergen Mann, Wilhelm Ulrich 2016-04-05
9052494 Optical imaging system with catoptric objective; broadband objective with mirror; and refractive lenses and broadband optical imaging system having two or more imaging paths Shiow-Hwei Hwang, Gregory L. Kirk, Hwan J. Jeong, Russel Hudyma 2015-06-09
9013677 Imaging optics, microlithography projection exposure apparatus having same and related methods Hans-Juergen Mann 2015-04-21
8908269 Immersion catadioptric projection objective having two intermediate images Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple +2 more 2014-12-09
8804234 Catadioptric projection objective including an aspherized plate Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple 2014-08-12
8730572 Catadioptric projection objective Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple +2 more 2014-05-20
8692986 EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafers Yung-Ho Alex Chuang, Richard W. Solarz, Bin-Ming Benjamin Tsai, David L. Brown 2014-04-08
8675276 Catadioptric imaging system for broad band microscopy Yung-Ho Alex Chuang, J. Joseph Armstrong 2014-03-18
8632195 Catoptric objectives and systems using catoptric objectives Hans-Juergen Mann, Wilhelm Ulrich 2014-01-21
8610877 Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type Hans-Juergen Mann 2013-12-17
8553217 EUV high throughput inspection system for defect detection on patterned EUV masks, mask blanks, and wafers Yung-Ho Alex Chuang, Richard W. Solarz, Bin-Ming Benjamin Tsai, David L. Brown 2013-10-08
8416490 Catadioptric projection objective Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple +2 more 2013-04-09
8363315 Catadioptric projection objective with mirror group Alexander Epple, Wilhelm Ulrich, Aurelian Dodoc, Hans-Juergen Mann 2013-01-29
8355201 Catadioptric projection objective Wilhelm Ulrich, Aurelian Dodoc, Rudolf Von Buenau, Hans-Juergen Mann, Alexander Epple +2 more 2013-01-15