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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Daniel L. Cavan — 11 Patents

Kla-Tencor: 5 patents #477 of 2,049Top 25%
INInsystems: 4 patents #1 of 5Top 20%
PEPerkinelmer: 1 patents #609 of 711Top 90%
Woodside, CA: #126 of 553 inventorsTop 25%
California: #56,011 of 386,348 inventorsTop 15%
Overall (All Time): #435,149 of 4,157,543Top 15%
11 Patents All Time
Daniel L. Cavan has been granted 11 US patents while listed as an inventor at Insystems. The first was granted in 1987 and the most recent in October 2019. Daniel L. Cavan ranks #435,149 of 4,157,543 US inventors in our database (top 10.5%). Patent records list Daniel L. Cavan in Woodside, CA, US.

Patents per Year

Patents granted per year, 1987 to 2019Bar chart with a peak of 2 patents in 1989.peak 21987: 1 patents19871988: 1 patents19881989: 2 patents19891992: 1 patents19922001: 1 patents20012007: 1 patents20072014: 1 patents20142015: 1 patents20152017: 1 patents20172019: 1 patents2019

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10429319 Inspection system including parallel imaging paths with multiple and selectable spectral bands Shiow-Hwei Hwang, Amir Bar, Grace Hsiu-Ling Chen 2019-10-01
9703207 System and method for reducing dynamic range in images of patterned regions of semiconductor wafers Grace Hsiu-Ling Chen 2017-07-11
9128064 Super resolution inspection system Grace Hsiu-Ling Chen, Qibiao Chen 2015-09-08
8643835 Active planar autofocus Scott A. Young, Yale Zhang, Aviv Balan 2014-02-04 $8,624,000
7227984 Method and apparatus for identifying defects in a substrate surface by using dithering to reconstruct under-sampled images 2007-06-05 $21,408,000
6316164 Proximity effect correction method through uniform removal of fraction of interior pixels N. William Parker, Alan D. Brodie, John H. McCoy 2001-11-13
RE33956 Inspection system for array of microcircuit dies having redundant circuit patterns Lawrence H. Lin, Robert B. Howe 1992-06-09
4811409 Method and apparatus for detecting defect information in a holographic image pattern 1989-03-07
4806774 Inspection system for array of microcircuit dies having redundant circuit patterns Lawrence H. Lin, Robert B. Howe 1989-02-21
4788431 Specimen distance measuring system William A. Eckes, Lee H. Veneklasen, Glen E. Howard, Donald J. McCarthy, Allen M. Carroll 1988-11-29
4659172 Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus 1987-04-21