Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10429319 | Inspection system including parallel imaging paths with multiple and selectable spectral bands | Shiow-Hwei Hwang, Amir Bar, Grace Hsiu-Ling Chen | 2019-10-01 |
| 9703207 | System and method for reducing dynamic range in images of patterned regions of semiconductor wafers | Grace Hsiu-Ling Chen | 2017-07-11 |
| 9128064 | Super resolution inspection system | Grace Hsiu-Ling Chen, Qibiao Chen | 2015-09-08 |
| 8643835 | Active planar autofocus | Scott A. Young, Yale Zhang, Aviv Balan | 2014-02-04 |
| 7227984 | Method and apparatus for identifying defects in a substrate surface by using dithering to reconstruct under-sampled images | — | 2007-06-05 |
| 6316164 | Proximity effect correction method through uniform removal of fraction of interior pixels | N. William Parker, Alan D. Brodie, John H. McCoy | 2001-11-13 |
| RE33956 | Inspection system for array of microcircuit dies having redundant circuit patterns | Lawrence H. Lin, Robert B. Howe | 1992-06-09 |
| 4811409 | Method and apparatus for detecting defect information in a holographic image pattern | — | 1989-03-07 |
| 4806774 | Inspection system for array of microcircuit dies having redundant circuit patterns | Lawrence H. Lin, Robert B. Howe | 1989-02-21 |
| 4788431 | Specimen distance measuring system | William A. Eckes, Lee H. Veneklasen, Glen E. Howard, Donald J. McCarthy, Allen M. Carroll | 1988-11-29 |
| 4659172 | Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus | — | 1987-04-21 |