Issued Patents All Time
Showing 25 most recent of 75 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307668 | Methods and systems for defects detection and classification using X-rays | Freddie Erich Babian | 2025-05-20 |
| 11688067 | Methods and systems for detecting defects in devices using X-rays | Scott Joseph Jewler, Freddie Erich Babian | 2023-06-27 |
| 11662479 | Methods and systems for printed circuit board design based on automatic corrections | Freddie Erich Babian, Scott Joseph Jewler | 2023-05-30 |
| 11651492 | Methods and systems for manufacturing printed circuit board based on x-ray inspection | Scott Joseph Jewler, Freddie Erich Babian, Andrew George Reid, Benjamin Thomas Adler | 2023-05-16 |
| 11619596 | X-ray photoemission system for 3-D laminography | — | 2023-04-04 |
| 11615533 | Methods and systems for product failure prediction based on X-ray image re-examination | Scott Joseph Jewler, Douglas A. Chrissan | 2023-03-28 |
| 11430118 | Methods and systems for process control based on X-ray inspection | Scott Joseph Jewler | 2022-08-30 |
| 11373778 | Devices processed using x-rays | — | 2022-06-28 |
| 11307152 | X-ray photoemission apparatus for inspection of integrated devices | — | 2022-04-19 |
| 11055821 | Super-resolution x-ray imaging method and apparatus | Edward Ratner | 2021-07-06 |
| 11042981 | Methods and systems for printed circuit board design based on automatic corrections | Freddie Erich Babian, Scott Joseph Jewler | 2021-06-22 |
| 10692184 | Super-resolution X-ray imaging method and apparatus | Edward Ratner | 2020-06-23 |
| 10559396 | Devices processed using x-rays | — | 2020-02-11 |
| 9646732 | High speed X-ray microscope | Benjamin Thomas Adler, Freddie Erich Babian | 2017-05-09 |
| 9607724 | Devices processed using x-rays | — | 2017-03-28 |
| 9529279 | Method and apparatus for inspecting a substrate | Kirk J. Bertsche, Mark A. McCord, Stuart L. Friedman | 2016-12-27 |
| 9291578 | X-ray photoemission microscope for integrated devices | — | 2016-03-22 |
| 9170503 | Method and apparatus for inspecting a substrate | Kirk J. Bertsche, Mark A. McCord, Stuart L. Friedman | 2015-10-27 |
| 9142382 | X-ray source with an immersion lens | Wenbing Yun, Thomas A. Case | 2015-09-22 |
| 9129715 | High speed x-ray inspection microscope | Benjamin Thomas Adler, Freddie Erich Babian | 2015-09-08 |
| 8995622 | X-ray source with increased operating life | Wenbing Yun, Thomas A. Case | 2015-03-31 |
| 8831179 | X-ray source with selective beam repositioning | Wenbing Yun, Thomas A. Case | 2014-09-09 |
| 8729470 | Electron microscope with an emitter operating in medium vacuum | — | 2014-05-20 |
| 8422010 | Methods and systems for determining a characteristic of a wafer | Michael D. Kirk, Christopher F. Bevis, Kris Bhaskar | 2013-04-16 |
| 8284394 | Methods and systems for determining a characteristic of a wafer | Michael D. Kirk, Christopher F. Bevis, Kris Bhaskar | 2012-10-09 |