Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11262288 | Beam shaping optics of flow cytometer systems and methods related thereto | John Heanue | 2022-03-01 |
| 10830686 | Beam shaping optics of flow cytometer systems and methods related thereto | John Heanue | 2020-11-10 |
| 10473694 | Optical source in microwave impedance microscopy | Michael M. Kelly | 2019-11-12 |
| 10274513 | Optically excited microwave impedance microscopy | Michael M. Kelly | 2019-04-30 |
| 10274413 | Beam shaping optics of flow cytometer systems and methods related thereto | John Heanue | 2019-04-30 |
| 9529279 | Method and apparatus for inspecting a substrate | David L. Adler, Kirk J. Bertsche, Mark A. McCord | 2016-12-27 |
| 9523857 | Beam shaping optics of flow cytometer systems and methods related thereto | John Heanue | 2016-12-20 |
| 9170503 | Method and apparatus for inspecting a substrate | David L. Adler, Kirk J. Bertsche, Mark A. McCord | 2015-10-27 |
| 8941049 | Readout methodology for multi-channel acquisition of spatially distributed signal | Gabor Toth, Khashayar Shadman | 2015-01-27 |
| 8629384 | Photomultiplier tube optimized for surface inspection in the ultraviolet | Stephen Biellak, Daniel Kavaldjiev | 2014-01-14 |
| 8489184 | System and method for determining electrode-tissue contact based on amplitude modulation of sensed signal | Brian P. Wilfley, Joseph Anthony Heanue | 2013-07-16 |
| 8237120 | Transverse focusing action in hyperbolic field detectors | Gabor Toth, Rudy F. Garcia, Mehran Nasser-Ghodsi, Khashayar Shadman, Ming Lun Yu | 2012-08-07 |
| 8160690 | System and method for determining electrode-tissue contact based on amplitude modulation of sensed signal | Brian P. Wilfley, Joseph Anthony Heanue | 2012-04-17 |
| 7635842 | Method and instrument for chemical defect characterization in high vacuum | Mehran Nasser-Ghodsi, Ming Lun Yu, Gabor Toth | 2009-12-22 |
| 7570354 | Image intensification for low light inspection | Wei Zhao | 2009-08-04 |
| 7171038 | Method and apparatus for inspecting a substrate | David L. Adler, Kirk J. Bertsche, Mark A. McCord | 2007-01-30 |
| 6717146 | Tandem microchannel plate and solid state electron detector | Tai-Hon Philip Chang, Ming Lun Yu | 2004-04-06 |
| 6642637 | Parallel plate electron multiplier | James Spallas | 2003-11-04 |
| 5798524 | Automated adjustment of an energy filtering transmission electron microscope | Michael Karl Kundmann, Alexander Jozef Gubbens, Ondrej L. Krivanek | 1998-08-25 |