Issued Patents All Time
Showing 25 most recent of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11181484 | Systems and methods for advanced defect ablation protection | Zhiwei Xu, Bret Whiteside, Steve Cui | 2021-11-23 |
| 10923526 | Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die | Tzi-Cheng Lai, Jehn-Huar Chem | 2021-02-16 |
| 10903258 | Image sensors with grounded or otherwise biased channel-stop contacts | Tzi-Cheng Lai, Jehn-Huar Chern | 2021-01-26 |
| 10734438 | Spread-spectrum clock-signal adjustment for image sensors | Tzi-Cheng Lai, Jehn-Huar Chern | 2020-08-04 |
| 10690599 | Radiation-induced false count mitigation and detector cooling | Tyler Trytko | 2020-06-23 |
| 10488348 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll +2 more | 2019-11-26 |
| 10462391 | Dark-field inspection using a low-noise sensor | Yung-Ho Alex Chuang, David L. Brown, Devis Contarato, John Fielden, Daniel Kavaldjiev +4 more | 2019-10-29 |
| 10241217 | System and method for reducing radiation-induced false counts in an inspection system | Ximan Jiang, Anatoly Romanovsky, Christian Wolters, Mous Tatarkhanov | 2019-03-26 |
| 9915622 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll +2 more | 2018-03-13 |
| 9891177 | TDI sensor in a darkfield system | Jijen Vazhaeparambil, Guoheng Zhao, Daniel Kavaldjiev, Anatoly Romanovsky, Ivan Maleev +5 more | 2018-02-13 |
| 9841512 | System and method for reducing radiation-induced false counts in an inspection system | Ximan Jiang, Anatoly Romanovsky, Christian Wolters, Mous Tatarkhanov | 2017-12-12 |
| 9678350 | Laser with integrated multi line or scanning beam capability | Christian Wolters, Jijen Vazhaeparambil, Dirk Woll, Anatoly Romanovsky, Bret Whiteside +1 more | 2017-06-13 |
| 9666419 | Image intensifier tube design for aberration correction and ion damage reduction | Ximan Jiang, Qing Li | 2017-05-30 |
| 9646379 | Detection of selected defects in relatively noisy inspection data | Haiguang Chen, Michael D. Kirk, Jaydeep Sinha | 2017-05-09 |
| 9460886 | High resolution high quantum efficiency electron bombarded CCD or CMOS imaging sensor | Ximan Jiang, John Fielden | 2016-10-04 |
| 9404873 | Wafer inspection with multi-spot illumination and multiple channels | Mehdi Vaez-Iravani | 2016-08-02 |
| 9355440 | Detection of selected defects in relatively noisy inspection data | Haiguang Chen, Michael D. Kirk, Jaydeep Sinha | 2016-05-31 |
| 9279774 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll +2 more | 2016-03-08 |
| 9194812 | Illumination energy management in surface inspection | Christian Wolters, Aleksey Petrenko, Kurt L. Haller, Juergen Reich, Zhiwei Xu +1 more | 2015-11-24 |
| 9182358 | Multi-spot defect inspection system | Zhiwei Xu, Christian Wolters, Juergen Reich, Bret Whiteside, Guoheng Zhao +3 more | 2015-11-10 |
| 9086389 | Sample inspection system detector | Daniel Kavaldjiev, Guoheng Zhao, Mehdi Vaez-Iravani | 2015-07-21 |
| 8786850 | Illumination energy management in surface inspection | Christian Wolters, Aleksey Petrenko, Kurt L. Haller, Juergen Reich, Zhiwei Xu +1 more | 2014-07-22 |
| 8629384 | Photomultiplier tube optimized for surface inspection in the ultraviolet | Daniel Kavaldjiev, Stuart L. Friedman | 2014-01-14 |
| 8582094 | Systems and methods for inspecting specimens including specimens that have a substantially rough uppermost layer | David W. Shortt, Christian Wolters | 2013-11-12 |
| 8520208 | Segmented polarizer for optimizing performance of a surface inspection system | Daniel Kavaldjiev | 2013-08-27 |