Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10923526 | Multi-pass imaging using image sensors with variably biased channel-stop contacts for identifying defects in a semiconductor die | Tzi-Cheng Lai, Stephen Biellak | 2021-02-16 |
| 9748294 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, David L. Brown +3 more | 2017-08-29 |