Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9406829 | Method of manufacturing a photovoltaic device | Pratima Addepalli, Benyamin Buller, Markus Gloeckler, Akhlesh Gupta, David Hwang +6 more | 2016-08-02 |
| 9383316 | Method of measuring vapor flux density | Markus Beck, Ulrich Bonne, Raffi Garabedian, Erel Milshtein | 2016-07-05 |
| 9177877 | Temperature-adjusted spectrometer | Markus Beck | 2015-11-03 |
| 8734536 | Temperature-adjusted spectrometer | Markus Beck | 2014-05-27 |
| 8646408 | Flux monitor | Markus Beck, Ulrich Bonne, Raffi Garabedian, Erel Milshtein | 2014-02-11 |
| 8472021 | Particle detector | Markus Beck, Robert Green, Raffi Garabedian, Erel Milshtein | 2013-06-25 |
| 8237120 | Transverse focusing action in hyperbolic field detectors | Gabor Toth, Rudy F. Garcia, Mehran Nasser-Ghodsi, Khashayar Shadman, Stuart L. Friedman | 2012-08-07 |
| 8052885 | Structural modification using electron beam activated chemical etch | Mehran Naser-Ghodsi, Garrett Pickard, Rudy F. Garcia, Kenneth Krzeczowski, Matthew Lent +3 more | 2011-11-08 |
| 8008207 | Use of ion implantation in chemical etching | Mehran Nasser-Ghodsi | 2011-08-30 |
| 7879730 | Etch selectivity enhancement in electron beam activated chemical etch | Mehran Naser-Ghodsi, Garrett Pickard, Rudy F. Garcia, Tzu-Chin Chuang, Kenneth Krzeczowski +4 more | 2011-02-01 |
| 7828622 | Sharpening metal carbide emitters | Alan D. Brodie, Mehran Nasser-Ghodsi | 2010-11-09 |
| 7755042 | Auger electron spectrometer with applied magnetic field at target surface | Gabor Toth, Rudy F. Garcia, Chris Huang, Niles K. MacDonald, Mehran Nasser-Ghodsi +3 more | 2010-07-13 |
| 7635842 | Method and instrument for chemical defect characterization in high vacuum | Mehran Nasser-Ghodsi, Stuart L. Friedman, Gabor Toth | 2009-12-22 |
| 7417233 | Beam exposure correction system and method | Scott Stovall, Benyamin Buller, Jimmy Iskandar | 2008-08-26 |
| 6759800 | Diamond supported photocathodes for electron sources | Andres Fernandez, Timothy N. Thomas, Xiaolan Chen, Steven Thomas Coyle, Marian Mankos | 2004-07-06 |
| 6717146 | Tandem microchannel plate and solid state electron detector | Tai-Hon Philip Chang, Stuart L. Friedman | 2004-04-06 |
| 6555830 | Suppression of emission noise for microcolumn applications in electron beam inspection | Marian Mankos, Tai-Hon Philip Chang, Kim Y. Lee | 2003-04-29 |