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Method of manufacturing a photovoltaic device |
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2016-08-02 |
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Method of measuring vapor flux density |
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2016-07-05 |
| 9177877 |
Temperature-adjusted spectrometer |
Markus Beck |
2015-11-03 |
| 8734536 |
Temperature-adjusted spectrometer |
Markus Beck |
2014-05-27 |
| 8646408 |
Flux monitor |
Markus Beck, Ulrich Bonne, Raffi Garabedian, Erel Milshtein |
2014-02-11 |
| 8472021 |
Particle detector |
Markus Beck, Robert Green, Raffi Garabedian, Erel Milshtein |
2013-06-25 |
| 8237120 |
Transverse focusing action in hyperbolic field detectors |
Gabor Toth, Rudy F. Garcia, Mehran Nasser-Ghodsi, Khashayar Shadman, Stuart L. Friedman |
2012-08-07 |
| 8052885 |
Structural modification using electron beam activated chemical etch |
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2011-11-08 |
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Use of ion implantation in chemical etching |
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2011-08-30 |
| 7879730 |
Etch selectivity enhancement in electron beam activated chemical etch |
Mehran Naser-Ghodsi, Garrett Pickard, Rudy F. Garcia, Tzu-Chin Chuang, Kenneth Krzeczowski +4 more |
2011-02-01 |
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Sharpening metal carbide emitters |
Alan D. Brodie, Mehran Nasser-Ghodsi |
2010-11-09 |
| 7755042 |
Auger electron spectrometer with applied magnetic field at target surface |
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2010-07-13 |
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Method and instrument for chemical defect characterization in high vacuum |
Mehran Nasser-Ghodsi, Stuart L. Friedman, Gabor Toth |
2009-12-22 |
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Beam exposure correction system and method |
Scott Stovall, Benyamin Buller, Jimmy Iskandar |
2008-08-26 |
| 6759800 |
Diamond supported photocathodes for electron sources |
Andres Fernandez, Timothy N. Thomas, Xiaolan Chen, Steven Thomas Coyle, Marian Mankos |
2004-07-06 |
| 6717146 |
Tandem microchannel plate and solid state electron detector |
Tai-Hon Philip Chang, Stuart L. Friedman |
2004-04-06 |
| 6555830 |
Suppression of emission noise for microcolumn applications in electron beam inspection |
Marian Mankos, Tai-Hon Philip Chang, Kim Y. Lee |
2003-04-29 |
