Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307668 | Methods and systems for defects detection and classification using X-rays | David L. Adler | 2025-05-20 |
| 11688067 | Methods and systems for detecting defects in devices using X-rays | David L. Adler, Scott Joseph Jewler | 2023-06-27 |
| 11662479 | Methods and systems for printed circuit board design based on automatic corrections | David L. Adler, Scott Joseph Jewler | 2023-05-30 |
| 11651492 | Methods and systems for manufacturing printed circuit board based on x-ray inspection | David L. Adler, Scott Joseph Jewler, Andrew George Reid, Benjamin Thomas Adler | 2023-05-16 |
| 11042981 | Methods and systems for printed circuit board design based on automatic corrections | David L. Adler, Scott Joseph Jewler | 2021-06-22 |
| 9646732 | High speed X-ray microscope | David L. Adler, Benjamin Thomas Adler | 2017-05-09 |
| 9129715 | High speed x-ray inspection microscope | David L. Adler, Benjamin Thomas Adler | 2015-09-08 |