Issued Patents All Time
Showing 1–25 of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11295438 | Method and system for mixed mode wafer inspection | Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2022-04-05 |
| 11120182 | Methodology of incorporating wafer physical measurement with digital simulation for improving semiconductor device fabrication | Shauh-Teh Juang | 2021-09-14 |
| 10754309 | Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow | Shauh-Teh Juang | 2020-08-25 |
| 10365617 | Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow | Shauh-Teh Juang | 2019-07-30 |
| 10192303 | Method and system for mixed mode wafer inspection | Allen Park, Ellis Chang, Richard Wallingford, Songnian Rong, Chetana Bhaskar | 2019-01-29 |
| 9916653 | Detection of defects embedded in noise for inspection in semiconductor manufacturing | — | 2018-03-13 |
| 9547745 | System and method for discovering unknown problematic patterns in chip design layout for semiconductor manufacturing | Shauh-Teh Juang | 2017-01-17 |
| 9142014 | System and method for identifying systematic defects in wafer inspection using hierarchical grouping and filtering | Shauh-Teh Juang | 2015-09-22 |
| 8938695 | Signature analytics for improving lithographic process of manufacturing semiconductor devices | Shauh-Teh Juang | 2015-01-20 |
| 8692878 | Methods and apparatus for simultaneously inspecting multiple array regions having different pitches | Hong Chen | 2014-04-08 |
| 8645100 | Status polling | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2014-02-04 |
| 8155428 | Memory cell and page break inspection | Xing Chu | 2012-04-10 |
| 8000922 | Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm | Hong Chen, Michael J. Van Riet, Chien-Huei Chen, Chris Maher, Michal Kowalski +4 more | 2011-08-16 |
| 7865037 | Memory load balancing | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2011-01-04 |
| D608505 | Double pet stroller | — | 2010-01-19 |
| 7602958 | Mirror node process verification | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2009-10-13 |
| 7570800 | Methods and systems for binning defects detected on a specimen | Xing Chu, Kenong Wu, Sharon McCauley | 2009-08-04 |
| 7555409 | Daisy chained topology | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2009-06-30 |
| 7440607 | Outlier substrate inspection | Hong Chen, Evgeni Shifrin, Ashok Kulkarni, Santosh Bhattacharyya, Wei Zhao +1 more | 2008-10-21 |
| 7440640 | Image data storage | Krishnamurthy Bhaskar, Mark J. Roulo | 2008-10-21 |
| 7379838 | Programmable image computer | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2008-05-27 |
| D569049 | Double decker pet carrier | — | 2008-05-13 |
| 7251586 | Full swath analysis | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2007-07-31 |
| 7218768 | Inspection method and apparatus for the inspection of either random or repeating patterns | David M. Evans, Bin-Ming Benjamin Tsai | 2007-05-15 |
| 7181368 | Status polling | Krishnamurthy Bhaskar, Mark J. Roulo, John S. Taylor, Lawrence R. Miller, Paul T. Russell +3 more | 2007-02-20 |