Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12259719 | Methods and mechanisms for preventing fluctuation in machine-learning model performance | Jui-Che Lin, Chao-Hsien Lee | 2025-03-25 |
| 12236077 | Methods and mechanisms for generating virtual knobs for model performance tuning | Jui-Che Lin, Yan-Jhu Chen, Chao-Hsien Lee, Pengyu Han, Wallace Wang | 2025-02-25 |
| 11120182 | Methodology of incorporating wafer physical measurement with digital simulation for improving semiconductor device fabrication | Jason Z. Lin | 2021-09-14 |
| 10754309 | Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow | Jason Z. Lin | 2020-08-25 |
| 10365617 | Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow | Jason Z. Lin | 2019-07-30 |
| 9547745 | System and method for discovering unknown problematic patterns in chip design layout for semiconductor manufacturing | Jason Z. Lin | 2017-01-17 |
| 9142014 | System and method for identifying systematic defects in wafer inspection using hierarchical grouping and filtering | Jason Z. Lin | 2015-09-22 |
| 8938695 | Signature analytics for improving lithographic process of manufacturing semiconductor devices | Jason Z. Lin | 2015-01-20 |
| 8539388 | Method and apparatus for low power semiconductor chip layout and low power semiconductor chip | Chewn-Pu Jou, Ming-Tsun Lin, Fu-Lung Hsueh | 2013-09-17 |
| 8318391 | Process window signature patterns for lithography process control | Jun Ye, Moshe E. Preil, Xun Chen, James Wiley | 2012-11-27 |
| 8057967 | Process window signature patterns for lithography process control | Jun Ye, Moshe E. Preil, Xun Chen, James Wiley | 2011-11-15 |
| 7853920 | Method for detecting, sampling, analyzing, and correcting marginal patterns in integrated circuit manufacturing | Moshe E. Preil, Jun Ye, James Wiley, Michael Gassner | 2010-12-14 |
| 7695876 | Method for identifying and using process window signature patterns for lithography process control | Jun Ye, Moshe E. Preil, Xun Chen, James Wiley | 2010-04-13 |
| 6748103 | Mechanisms for making and inspecting reticles | Lance Glasser, Jun Ye, David Alles, James Wiley | 2004-06-08 |
| 6654489 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, David Alles, Yen-Wen Lu, Yu Cao | 2003-11-25 |
| 6529621 | Mechanisms for making and inspecting reticles | Lance Glasser, Jun Ye, David Alles, James Wiley | 2003-03-04 |
| 6516085 | Apparatus and methods for collecting global data during a reticle inspection | James Wiley, Jun Ye, David Alles, Yen-Wen Lu, Yu Cao | 2003-02-04 |