Issued Patents All Time
Showing 1–25 of 67 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360461 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more | 2025-07-15 |
| 12204250 | Training methods for machine learning assisted optical proximity error | Jing Su, Ya Luo | 2025-01-21 |
| 11977336 | Method for improving a process for a patterning process | Jen-Shiang Wang, Qian Zhao, Yunbo Guo, Mu FENG, Qiang Zhang | 2024-05-07 |
| 11789371 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Peng Liu, Rafael C. Howell, Roshni Biswas | 2023-10-17 |
| 11768440 | Training methods for machine learning assisted optical proximity error correction | Jing Su, Ya Luo | 2023-09-26 |
| 11734490 | Method for determining curvilinear patterns for patterning device | Quan Zhang, Been-Der Chen, Rafael C. Howell, Jing Su, Yi Zou | 2023-08-22 |
| 11561477 | Training methods for machine learning assisted optical proximity error correction | Jing Su, Ya Luo | 2023-01-24 |
| 11443083 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more | 2022-09-13 |
| 11409203 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Peng Liu, Rafael C. Howell, Roshni Biswas | 2022-08-09 |
| 11379648 | Process window identifier | Frank Gang Chen, Joseph Werner De Vocht, Yuelin Du, Wanyu Li | 2022-07-05 |
| 11353797 | Method and apparatus for controlling a computing process | Xiaorui Chen, Yang LIN | 2022-06-07 |
| 11232249 | Method for determining curvilinear patterns for patterning device | Quan Zhang, Been-Der Chen, Rafael C. Howell, Jing Su, Yi Zou | 2022-01-25 |
| 11016395 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Peng Liu, Rafael C. Howell, Roshni Biswas | 2021-05-25 |
| 10996565 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Peng Liu, Ya Luo, Yu Cao | 2021-05-04 |
| 10948831 | Methods of determining process models by machine learning | Ya Luo, Yu Cao, Jen-Shiang Wang | 2021-03-16 |
| 10755025 | Process window identifier | Frank Gang Chen, Joseph Werner De Vocht, Yuelin Du, Wanyu Li | 2020-08-25 |
| 10296681 | Process based metrology target design | Guangqing Chen, Shufeng Bai, Eric Kent, Paul Anthony Tuffy, Jen-Shiang Wang +3 more | 2019-05-21 |
| 10007744 | Process based metrology target design | Guangqing Chen, Shufeng Bai, Eric Kent, Paul Anthony Tuffy, Jen-Shiang Wang +3 more | 2018-06-26 |
| 9903823 | Metrology method and apparatus | Jay Jianhui Chen, Wei-Cheng Liu, Boris Menchtchikov, Jen-Shiang Wang, Te-Chih Huang | 2018-02-27 |
| 9842186 | Process window identifier | Frank Gang Chen, Joseph Werner De Vocht, Yuelin Du, Wanyu Li | 2017-12-12 |
| 9619607 | Method and apparatus for cost function based simultaneous OPC and SBAR optimization | Jun Tao, Been-Der Chen, Jiangwei Li, Min-Chun Tsai, Dong Mao | 2017-04-11 |
| D782493 | Stand for a display | — | 2017-03-28 |
| D763813 | Television | Kuei-Min Pan | 2016-08-16 |
| 9418194 | Method and apparatus for model based flexible MRC | Taihui Liu, Been-Der Chen | 2016-08-16 |
| D760233 | Stand for a display | — | 2016-06-28 |