Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11281113 | Method for determining stack configuration of substrate | Danying LI, Chi-Hsiang Fan, Abdalmohsen Elmalk, Youping Zhang, Kui Huang | 2022-03-22 |
| 10983440 | Selection of substrate measurement recipes | Jen-Shiang Wang | 2021-04-20 |
| 10551750 | Metrology method and apparatus and associated computer product | Adam Jan URBANCZYK, Hans Van Der Laan, Grzegorz Grzela, Alberto Da Costa Assafrao, Chien-Hung Tseng | 2020-02-04 |
| 10310388 | Metrology method and apparatus and associated computer product | Adam Jan URBANCZYK, Hans Van Der Laan, Grzegorz Grzela, Alberto Da Costa Assafrao, Chien-Hung Tseng | 2019-06-04 |
| 9903823 | Metrology method and apparatus | Yen-Wen Lu, Wei-Cheng Liu, Boris Menchtchikov, Jen-Shiang Wang, Te-Chih Huang | 2018-02-27 |
| 8094428 | Wafer grounding methodology | Yi Wang, Juying Dou, Kenichi Kanai, Jun Jiang, Zheng Fan +1 more | 2012-01-10 |