Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11372343 | Alignment method and associated metrology device | Henricus Martinus Johannes Van De Groes, Johannes Hubertus Antonius Van De Rijdt, Marcel Pieter Jacobus Peeters, Henricus Petrus Maria Pellemans | 2022-06-28 |
| 10551750 | Metrology method and apparatus and associated computer product | Adam Jan URBANCZYK, Hans Van Der Laan, Grzegorz Grzela, Alberto Da Costa Assafrao, Jay Jianhui Chen | 2020-02-04 |
| 10310388 | Metrology method and apparatus and associated computer product | Adam Jan URBANCZYK, Hans Van Der Laan, Grzegorz Grzela, Alberto Da Costa Assafrao, Jay Jianhui Chen | 2019-06-04 |
| 10107761 | Method and device for focusing in an inspection system | Yevgeniy Konstantinovich Shmarev, Stanislav Smirnov, Armand Eugene Albert Koolen | 2018-10-23 |