Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11972194 | Method for determining patterning device pattern based on manufacturability | Rafael C. Howell, Cuiping Zhang, Ningning Jia, Jingjing Liu, Quan Zhang | 2024-04-30 |
| 11789371 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Yen-Wen Lu, Peng Liu, Rafael C. Howell | 2023-10-17 |
| 11580289 | Method for determining patterning device pattern based on manufacturability | Rafael C. Howell, Cuiping Zhang, Ningning Jia, Jingjing Liu, Quan Zhang | 2023-02-14 |
| 11409203 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Yen-Wen Lu, Peng Liu, Rafael C. Howell | 2022-08-09 |
| 11016395 | Methods of determining scattering of radiation by structures of finite thicknesses on a patterning device | Yu Cao, Yen-Wen Lu, Peng Liu, Rafael C. Howell | 2021-05-25 |