Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11650576 | Knowledge recommendation for defect review | Wei Fang, Robeter Jian, YI-YING WANG, Shih-Tsung Chen, Jian-Min Liao +5 more | 2023-05-16 |
| 11416979 | Defect displaying method | Wei Fang, Ju Hao Chien, YI-YING WANG, Shih-Tsung Chen, Jian-Min Liao +5 more | 2022-08-16 |
| 8532949 | Computer-implemented methods and systems for classifying defects on a specimen | Tommaso Torelli, Dominic David, Chiuman Yeung, Michael Gordon Scott, Lalita A. Balasubramanian +5 more | 2013-09-10 |
| 8502146 | Methods and apparatus for classification of defects using surface height attributes | Chien-Huei Chen, Hedong Yang | 2013-08-06 |
| 8289510 | Process excursion detection | Patrick Huet, Robinson Piramuthu, Martin Plihal, Christopher Lee, Yan Xiong | 2012-10-16 |
| 7646476 | Process excursion detection | Patrick Huet, Robinson Piramuthu, Martin Plihal, Christopher Lee, Yan Xiong | 2010-01-12 |
| 7394534 | Process excursion detection | Patrick Huet, Robinson Piramuthu, Martin Plihal, Christopher Lee, Yan Xiong | 2008-07-01 |