Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8532949 | Computer-implemented methods and systems for classifying defects on a specimen | Cho H. Teh, Tommaso Torelli, Dominic David, Chiuman Yeung, Michael Gordon Scott +5 more | 2013-09-10 |
| 8126255 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Kris Bhaskar, Chetana Bhaskar, Ashok Kulkarni, Eliezer Rosengaus, Cecelia Campochiaro +6 more | 2012-02-28 |