Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12299848 | Deep learning image denoising for semiconductor-based applications | Aditya Gulati, Raghavan Konuru, Saravanan Paramasivam, Martin Plihal, Prasanti Uppaluri | 2025-05-13 |
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Saravanan Paramasivam, Martin Plihal, Sairam Ravu, Prasanti Uppaluri | 2022-07-05 |
| 11055840 | Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection | Ardis Liang, Martin Plihal, Saravanan Paramasivam, Sandeep Bhagwat | 2021-07-06 |