Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11676264 | System and method for determining defects using physics-based image perturbations | Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sairam Ravu, Somesh Challapalli +1 more | 2023-06-13 |
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Saravanan Paramasivam, Martin Plihal, Niveditha Lakshmi Narasimhan, Sairam Ravu, Prasanti Uppaluri | 2022-07-05 |
| 11151707 | System and method for difference filter and aperture selection using shallow deep learning | Santosh Bhattacharyya, Saravanan Paramasivam, Martin Plihal | 2021-10-19 |
| 5121339 | Laser weld fault detection system | David J. Jenuwine | 1992-06-09 |
| 4946281 | Laser profiler for high precision surface dimensional grouping apparatus and method | Mark L. Dell'Eva, Chieh-Yi Jerry Yen | 1990-08-07 |