Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11676264 | System and method for determining defects using physics-based image perturbations | Martin Plihal, Saravanan Paramasivam, Jacob George, Niveditha Lakshmi Narasimhan, Somesh Challapalli +1 more | 2023-06-13 |
| 11379967 | Methods and systems for inspection of semiconductor structures with automatically generated defect features | Jacob George, Saravanan Paramasivam, Martin Plihal, Niveditha Lakshmi Narasimhan, Prasanti Uppaluri | 2022-07-05 |
| 11237119 | Diagnostic methods for the classifiers and the defects captured by optical tools | Martin Plihal, Erfan Soltanmohammadi, Saravanan Paramasivam, Ankit Jain, Prasanti Uppaluri +1 more | 2022-02-01 |
| 10267748 | Optimizing training sets used for setting up inspection-related algorithms | Martin Plihal, Erfan Soltanmohammadi, Saravanan Paramasivam, Ankit Jain, Sarath Shekkizhar +1 more | 2019-04-23 |