Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Brian Duffy, Andrew Cross, Kaushik Sah, Antonio Mani | 2020-06-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Brian Duffy, Andrew Cross, Kaushik Sah, Antonio Mani | 2020-06-30 |