Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11784097 | Measurement of overlay error using device inspection system | Choon Hoong Hoo, Fangren Ji, Amnon Manassen, Liran Yerushalmi, Allen Park +3 more | 2023-10-10 |
| 10943838 | Measurement of overlay error using device inspection system | Choon Hoong Hoo, Fangren Ji, Amnon Manassen, Liran Yerushalmi, Allen Park +3 more | 2021-03-09 |
| 10699926 | Identifying nuisances and defects of interest in defects detected on a wafer | Martin Plihal, Brian Duffy, Mike VonDenHoff, Andrew Cross, Kaushik Sah | 2020-06-30 |
| 10598617 | Metrology guided inspection sample shaping of optical inspection results | Kaushik Sah, Andrew Cross | 2020-03-24 |