Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11784097 | Measurement of overlay error using device inspection system | Fangren Ji, Amnon Manassen, Liran Yerushalmi, Antonio Mani, Allen Park +3 more | 2023-10-10 |
| 10943838 | Measurement of overlay error using device inspection system | Fangren Ji, Amnon Manassen, Liran Yerushalmi, Antonio Mani, Allen Park +3 more | 2021-03-09 |