Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10902579 | Creating and tuning a classifier to capture more defects of interest during inspection | Erfan Soltanmohammadi, Martin Plihal, Sang Hyun Lee | 2021-01-26 |
| 9489599 | Decision tree construction for automatic classification of defects on semiconductor wafers | Chien-Huei Chen, Chris Maher, Patrick Huet, John R. Jordan | 2016-11-08 |