Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253473 | Electronic system of specimen qualification | Hung-Chih Chang, Chug-Chi Chu, Chi-Min Tu | 2025-03-18 |
| 12211200 | Wafer inspection system method | Chia-Lin Tsai, Hung-Ru Li | 2025-01-28 |
| 12148144 | Wafer inspection system | Chia-Lin Tsai, Hung-Ru Li | 2024-11-19 |
| 12019032 | Electronic system and method of specimen qualification | Hung-Chih Chang, Chug-Chi Chu, Chi-Min Tu | 2024-06-25 |
| 11486899 | Wafer test system and methods thereof | Chia-Lin Tsai, Tien-Yu Chen, Chia-Yi Lin | 2022-11-01 |