Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211200 | Wafer inspection system method | Chia-Lin Tsai, Wun-Ye Ku | 2025-01-28 |
| 12148144 | Wafer inspection system | Chia-Lin Tsai, Wun-Ye Ku | 2024-11-19 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211200 | Wafer inspection system method | Chia-Lin Tsai, Wun-Ye Ku | 2025-01-28 |
| 12148144 | Wafer inspection system | Chia-Lin Tsai, Wun-Ye Ku | 2024-11-19 |