Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10949964 | Super-resolution defect review image generation through generative adversarial networks | Anuj Pandey, Bradley Ries, Himanshu Vajaria, Yong Zhang | 2021-03-16 |
| 9996942 | Sub-pixel alignment of inspection to design | Santosh Bhattacharyya, Pavan Kumar, Lisheng Gao, Thirupurasundari Jayaraman, Raghav Babulnath +4 more | 2018-06-12 |
| 9518934 | Wafer defect discovery | Hong Chen, Kenong Wu, Martin Plihal, Vidur Pandita, Ravikumar Sanapala +4 more | 2016-12-13 |