Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Ashok Kulkarni, Jason Kirkwood +2 more | 2016-06-07 |
| 9053390 | Automated inspection scenario generation | Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Jason Kirkwood, Ashok Kulkarni +3 more | 2015-06-09 |