Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12115685 | Fast and robust initialization method for feature-based monocular visual SLAM using inertial odometry assistance | Yi Chen, Zhicai Ou | 2024-10-15 |
| 11790041 | Method and system for reducing false positives in object detection neural networks caused by novel objects | Yunke Tian, Mohamad Al Jazaery, Sathyanarayanan Muthusamy, Zhicai Ou | 2023-10-17 |
| 11439292 | System and method for recommending object placement | Yi-An Chen, Yunke Tian | 2022-09-13 |
| 11120311 | Adjusting machine settings through multi-pass training of object detection models | Yuxiang Gao, Zhicai Ou | 2021-09-14 |
| 11048976 | Method and system for controlling machines based on object recognition | Yunke Tian, Zhicai Ou | 2021-06-29 |
| 10790114 | Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages | Ichiro Honjo, Christopher Sears, Hedong Yang, Jianwei Wang, Huina Xu | 2020-09-29 |
| 10733744 | Learning based approach for aligning images acquired with different modalities | Scott A. Young, Mohan Mahadevan | 2020-08-04 |
| 10670535 | Automated pattern fidelity measurement plan generation | Brian Duffy, Ajay Gupta | 2020-06-02 |
| 10267746 | Automated pattern fidelity measurement plan generation | Brian Duffy, Ajay Gupta | 2019-04-23 |
| 10062543 | Determining multi-patterning step overlay error | Ajay Gupta, Olivier Moreau, Kumar Raja | 2018-08-28 |
| 9483819 | Contour-based array inspection of patterned defects | Chien-Huei Chen, Ajay Gupta, Jianwei Wang, Hedong Yang, Christopher Maher +1 more | 2016-11-01 |