Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8669523 | Contour-based defect detection using an inspection apparatus | Chien-Huei Chen, Michael J. Van Riet, Sankar Venkataraman, Hai Jiang, Hedong Yang +1 more | 2014-03-11 |
| D480892 | Vertically retractable cabinet | — | 2003-10-21 |
| 5680250 | Viewing assembly including prisms and mirrors rotatable about axes transverse to the line of sight | — | 1997-10-21 |