Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10809635 | Defect inspection method and defect inspection system | Chien-Huei Chen, Hung-Yi Chung, Cheng-Kuang Lee, Xiaomeng Chen, Teng-Cheng Hsu | 2020-10-20 |
CH
Chao-Ting Hong
Overall (All Time): #2,821,726 of 4,157,543Top 70%
1
Patents All Time