Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7925072 | Methods for identifying array areas in dies formed on a wafer and methods for setting up such methods | Chien-Huei Chen, Ajay Gupta, Richard Wallingford, Kaustubh (Kaust) Namjoshi, Michael Cook | 2011-04-12 |
| 7747062 | Methods, defect review tools, and systems for locating a defect in a defect review process | Da Chen, Christophe David Fouquet, Saibal Banerjee, Santosh Bhattacharyya, Joe Wang +2 more | 2010-06-29 |
| 7570797 | Methods and systems for generating an inspection process for an inspection system | David Wang, Patrick Huet, Tong Huang, Martin Plihal, Adam Chen +1 more | 2009-08-04 |